Facilities
Electron Microscopes
JEM-ARM200F NEOARM / Jeol
aberration corrected (S)TEM @CCRF
Fusion Select / Protochips : In-situ electrothermal TEM holder
(Heating + Biasing) with AXON Synchronicity module
Focused Ion Beam / FEI, Helios G5 CX
Transmission Electron Microscope (JEM-2100F) @CCRF
JEM-2010 / Jeol : TEM @ECEP
Focused Ion Beam / FEI, Helios G3 CX @ CCRF
FE-EPMA / Jeol JXA-8530F Plus @ CCRF
JSM-5610 / Jeol : Normal SEM with EDS
SU5000 / Hitach : FE-SEM with EDS/EBSD @Core center
JSM-7900F / Jeol : FE-SEM with EDS
@ECEP
Sample preparation facilities
MultiPrep system
Gatan PIPS II
(Ion polishing)
@CCRF
Metprep 1X precision grinder/polisher
Techcut / Low speed saw
Gatan Dimpler
@CCRF
Pol-V 300 / Vibrational polisher
Mounting press
Inverted microscope
Upright microscope
Digital microscope
Carbon coater
Sputter coater (Pt)
Materials Process
Glove box-integrated furnace with Turbo pump
(H2, N2 gas available)
Furnace with Turbo pump
(H2, N2 gas available)
Planetary Ball Mill, PM 100
Arc Melter, MAM-1